Ionizing Radiation Effects in MOS Devices and Circuits
Editorial Reviews
Book Description
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
The publisher, John Wiley & Sons
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
Ionizing Radiation Effects in MOS Devices and Circuits,T. P. Ma,Paul V. Dressendorfer,Wiley-Interscience,047184893X,Effect of radiation on,Electronics - Semiconductors,General,Metal Oxide Semiconductors (Mos),Metal oxide semiconductors,Physical Properties Of Materials,Radiation,Science,Science/Mathematics,Circuits & components,Technology / Electronics / Semiconductors
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